Local Structure of Implicated Pd in Si Using PAC

D. A. Brett, R. Dogra, A. P. Byrne, M. C. Ridgway, J. Bartels and R. Vianden

Hyperfine Interactions (2004), Volume 158, Numbers 1-4, November 2005, p 299-303

DOI Link: 10.1007/s10751-005-9048-9

Abstract:

TDPAC has been employed to study the local structure of implanted palladium in silicon utilizing 87&151;75 keV γ-γ cascade of probe nucleus 100Pd. The observed hyperfine parameters revealed the presence of Pd-V defect pair only in highly doped n-type silicon. A dumbbell structure with substitutional palladium and silicon vacancy as nearest neigbor is suggested for this defect.